AnisoVision

Authors (publication): Anubhav Paul, Kumar Rishav, Guus Klootwijk, Mitradeep Sarkar, Onima Bisht, Zizheng Li, Sonia Conesa-Boj, Georgia T. Papadakis, Silvania F. Pereira

This repository contains the models, datasets, and result files supporting the publication “Characterization of the 3D-Optical Properties of van der Waals Materials with Deep Learning-Based Coherent Fourier Scatterometry” (ACS Photonics, 2026; DOI: 10.1021/acsphotonics.5c02153). It includes the AnisoVision deep-learning pipeline trained on large-scale synthetic data generated with forward electromagnetic modeling (Berreman 4×4 formalism), and provides scripts to reproduce the paper’s main analyses and figures, as well as example data to run inference and compare against experimental measurements of isotropic and anisotropic thin-film flakes.